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Joined 11 months ago
Cake day: June 26th, 2024
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9·5 months agoYield over die area should be the metric.
If you have a chip that is 50% of the wafer area, a single fault will lead to a yield of 50%. Now compare it with a chip that is 1% of the wafer area, the same single fault gets a yield of 99%.
So comparing the yields of two processes without factoring in the die area is not a fair game.
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